In Situ thickness measurements of chemical bath-deposited CdS

Solar Energy Materials and Solar Cells

Volumn 94, Issue 2, 2010, Pages 333-337

  Mann, J R ^a   Vora, N ^a   Repins, I L ^a  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

Cadmium sulfide; CIGS; Interference measurement; Sensor; Thickness

Indexed keywords

CADMIUM SULFIDE; CDS; CHEMICAL BATH; CU(IN , GA)SE; DIFFERENT SUBSTRATES; GROWING FILMS; IN-SITU MEASUREMENT; IN-SITU THICKNESS MEASUREMENT; INTERFERENCE MEASUREMENTS; MOLYBDENUM FILMS; OPTICAL REFLECTANCE; QUARTZ CRYSTAL MONITORS;

CADMIUM; COPPER; GALLIUM; MEASUREMENTS; MOLYBDENUM; OXIDE MINERALS; QUARTZ; SENSORS; THICKNESS MEASUREMENT;

SEMICONDUCTING CADMIUM COMPOUNDS;

EID: 72149118438     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2009.10.009     Document Type: Article

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