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Volumn , Issue , 2009, Pages 420-423

DC characteristics of Junction Vertical Slit Field-Effect Transistor (JVeSFET)

Author keywords

JFET; JVeSFET; Vertical slit transistor integrated circuit

Indexed keywords

DC CHARACTERISTICS; DEEP SUB-MICRON; DUAL GATES; FEASIBILITY STUDIES; JFET; JVESFET; LAYOUT REGULARITY; NANO-SIZE; SIMULATION-BASED;

EID: 72149115395     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (10)

References (6)
  • 1
    • 0028721241 scopus 로고
    • Study of proton radiation effects on analog IC designed for high energy physics in a BiCMOS-JFET radhard SOI technology
    • December
    • L. Blanquart et al., "Study of proton radiation effects on analog IC designed for high energy physics in a BiCMOS-JFET radhard SOI technology", IEEE Trans. on Nucl. Sci., vol. 41 (6), pp. 2525-2529, December 1994.
    • (1994) IEEE Trans. on Nucl. Sci. , vol.41 , Issue.6 , pp. 2525-2529
    • Blanquart, L.1
  • 2
    • 0033311406 scopus 로고    scopus 로고
    • Industrial transfer and stabilization of a CMOS-JFET bipolar radiation-hard analog-digital SOI technology
    • August
    • M. Dentan et al., "Industrial transfer and stabilization of a CMOS-JFETbipolar radiation-hard analog-digital SOI technology", IEEE Trans. on Nucl. Sci., vol. 46 (4), pp. 822-828, August 1999.
    • (1999) IEEE Trans. on Nucl. Sci. , vol.46 , Issue.4 , pp. 822-828
    • Dentan, M.1
  • 3
    • 33845438685 scopus 로고    scopus 로고
    • Characterization and modelling of flicker noise in junction field-effect transistor with source and drain trench isolation
    • Y. Fu, H. Wong, and J. J. Liou, "Characterization and modelling of flicker noise in junction field-effect transistor with source and drain trench isolation", Microelectronics Reliab., vol. 47, pp. 46-50, 2007.
    • (2007) Microelectronics Reliab. , vol.47 , pp. 46-50
    • Fu, Y.1    Wong, H.2    Liou, J.J.3
  • 6
    • 0026954339 scopus 로고
    • Two-dimensional analysis of ion-implanted, bipolar-compatible, long- and short-channel junction field-effect transistors
    • November
    • W. W. Wong, and J. J. Liou, "Two-dimensional analysis of ion-implanted, bipolar-compatible, long- and short-channel junction field-effect transistors", IEEE Trans. On Electron Dev., vol. 39 (11), pp. 2576-2582, November 1992.
    • (1992) IEEE Trans. on Electron Dev. , vol.39 , Issue.11 , pp. 2576-2582
    • Wong, W.W.1    Liou, J.J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.