Analyzing survival data with highly negatively skewed distribution: The Gompertz-sinh family

Journal of Applied Statistics

Volumn 37, Issue 1, 2010, Pages 1-11

  Cooray, Kahadawala ^a   Ananda, Malwane M A ^b  

^a CENTRAL MICHIGAN UNIVERSITY   (United States)

^b UNIVERSITY OF NEVADA   (United States)

Author keywords

Gompertz distribution; Goodness of fit; Maximum likelihood

Indexed keywords

EID: 72149094044     PISSN: 02664763     EISSN: 13600532     Source Type: Journal    
DOI: 10.1080/02664760802663072     Document Type: Article

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