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Volumn 32, Issue 4, 2009, Pages 794-799

Hardening and softening in AlSi1 bond contacts during ultrasonic wire bonding

Author keywords

AlSi1; Dynamic recrystallization; Interface; Microhardness; Softening and hardening; Ultrasonic wedge wedge bonding

Indexed keywords

ALSI1; BOND CONTACT; BONDING TIME; COLD WORKED; DEFORMATION CURVES; DYNAMIC PROCESS; GRAIN SIZE; GRAIN STRUCTURES; INTERFACE; PREDEFORMED; RECRYSTALLIZATIONS; SOFTENING AND HARDENING; ULTRASONIC ENERGY; ULTRASONIC WIRE BONDING; WEDGE BONDING; WIRE BONDING;

EID: 72149083838     PISSN: 15213331     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAPT.2008.2009930     Document Type: Article
Times cited : (29)

References (9)
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    • U. Geißler,M. Schneider-Ramelow, K.-D. Lang, and H. Reichl, "Investigation of microstructural processes during ultrasonic wedge/wedgebonding of AlSi1 wires.," J. Electron. Mater., vol.35, pp. 173-180, 2006.
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  • 8
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    • Ver- oder entfestigung von aluminiumdrähten beim ultraschall-wedge-wedge-bonden
    • M. Schneider-Ramelow, A. Ferber, and K.-D. Lang, "Ver- oder entfestigung von aluminiumdrähten beim ultraschall-wedge-wedge-bonden, " PLUS, vol.6, no.4, pp. 637-643, 2004.
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  • 9
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    • Microstructural characteristics of Au/Al bonded interfaces
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.