Antiferromagnetic-paramagnetic insulating transition in Cr-doped V 2O3 investigated by EXAFS analysis

Journal of Physics Condensed Matter

Volumn 21, Issue 35, 2009, Pages

  Meneghini, C ^a,b   Di Matteo, S ^c   Monesi, C ^a   Neisius, T ^d   Paolasini, L ^b   Mobilio, S ^a,b,e   Natoli, C R ^e   Metcalf, P A ^f   Honig, J M ^f  

^a ROMA TRE UNIVERSITY   (Italy)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c UNIVERSITÉ DE RENNES 1   (France)

^d AIX MARSEILLE UNIVERSITY   (France)

^e INFN LABORATORI NAZIONALI DI FRASCATI   (Italy)

^f PURDUE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIFERROMAGNETISM; CHROMIUM; EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; INSULATION; PARAMAGNETISM; X RAY ABSORPTION;

ANTIFERROMAGNETIC INSULATING PHASE; CURRENT THEORETICAL MODELS; EXTENDED XRAY ABSORPTION FINE STRUCTURE (EXAFS) SPECTROSCOPIES; MONOCLINIC SYMMETRY; STRUCTURAL EVOLUTION; STRUCTURAL MODIFICATIONS; TRANSMISSION GEOMETRIES; WIDE TEMPERATURE RANGES;

CHROMIUM COMPOUNDS;

EID: 72049119909     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/21/35/355401     Document Type: Article

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