Improving the conductivity of single-walled carbon nanotubes films by heat treatment

Journal of Alloys and Compounds

Volumn 485, Issue 1-2, 2009, Pages 456-461

  Wang, Jiaping ^a   Sun, Jing ^a   Gao, Lian ^a   Liu, Yangqiao ^a   Wang, Yan ^a   Zhang, Jing ^a   Kajiura, Hisashi ^b   Li, YongMing ^b   Noda, Kazuhiro ^b  

^a SHANGHAI INSTITUTE OF CERAMICS   (China)

^b SONY CORPORATION   (Japan)

Author keywords

Conductivity; Filtration method; Heat treatment; SWNTs films

Indexed keywords

AFTER-HEAT TREATMENT; COMPREHENSIVE PERFORMANCE; CONDUCTIVITY; DISPERSANTS; INTERFERENCE MICROSCOPES; REFLECTED LIGHT; SCANNING ELECTRON MICROSCOPES; SINGLE-WALLED CARBON; TRANSMISSION ELECTRON MICROSCOPE;

CARBON FILMS; CARBON NANOTUBES; ELECTRIC RESISTANCE; ELECTRON MICROSCOPES; HEAT TREATMENT; LIGHT TRANSMISSION; POROUS MATERIALS; SCANNING ELECTRON MICROSCOPY; SINGLE-WALLED CARBON NANOTUBES (SWCN); SURFACE ACTIVE AGENTS; THERMAL EFFECTS; TRANSMISSION ELECTRON MICROSCOPY;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 72049088488     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2009.05.139     Document Type: Article

References (22)

1. Minami T., and Miyata T. Thin Solid Films 517 (2008) 1474-1477
2. Moholkar A.V., Pawar S.M., Rajpure K.Y., Ganesan V., and Bhosale C.H. J. Alloys Compd. 464 (2008) 387-392
3. Zhang Y.Z., Wu L.H., Li H., Xu J.H., Han L.Z., Wang B.C., Tuo Z.L., and Xie E.Q. J. Alloys Compd. 473 (2009) 319-322
4. Wu Z.H., Chen Z.H., Du X., Logan J.M., Sippel J., Nikolou M., Kamaras K., Reynolds J.R., Tanner D.B., Hebard A.F., and Rinzler A.G. Science 305 (2004) 1273-1276
5. Zhang Y.P., Sun X.W., Pan L.K., Li H.B., Sun Z., Sun C.Q., and Tay B.K. J. Alloys Compd. (2009) 10.1016/j.jallcom.2009.01.114
6. Zhou Y.X., Hu L.B., and GrÜner G. Appl. Phys. Lett. 88 (2006) 123109
7. Moon J.S., Park J.H., Lee T.Y., Kim Y.W., Yoo J.B., Park C.Y., Kim J.M., and Jin K.W. Diam. Relat. Mater. 14 (2005) 1882-1887
8. Spotnitz M.E., Ryan D., and Stone H.A. J. Mater. Chem. 14 (2004) 1299-1302
9. Sreekumar T.V., Liu T., and Kumar S. Chem. Mater. 15 (2003) 175-178
10. Meitl M.A., Zhou Y.X., Gaur A., Jeon S., Usrey M.L., Strano M.S., and Rogers J.A. Nano Lett. 4 (2004) 1643-1647
11. Anglada N.F., Kaempgen M., Skakalova V., Weglikowska U.D., and Roth S. Diam. Relat. Mater. 13 (2004) 256-260
12. Kim Y., Minami N., Zhu W.H., Kazaoui S., Azumi R., and Matsumoto M. Jpn. J. Appl. Phys. 42 (2003) 7629-7634
13. Hu L., Hecht D.S., and GrÜner G. Nano Lett. 4 (2004) 2513-2517
14. Zhang D.H., Ryu K., Liu X.L., Polikarpov E., Ly J., Tompson M.E., and Zhou C.W. Nano Lett. 6 (2006) 1880-1886
15. Geng H.Z., Kim K.K., So K.P., Lee Y.S., Chang Y.K., and Am Y.H.L.J. Chem. Soc. 129 (2007) 7758-7759
16. Tantang H., Ong J.Y., Loh C.L., Dong X.C., Chen P., Chen Y., Hu X., Tan L.P., and Li L. Carbon 47 (2009) 1867-1885
17. Itkis M.E., Perea D.E., Jung R., Niyogi S., and Haddon R.C. J. Am. Chem. Soc. 127 (2005) 3439-3448
18. Liu Y.Q., Gao L., Sun J., Zheng S., Jiang L.Q., Wang Y., Kajiura H., Li Y.M., and Noda K. Carbon 45 (2007) 1972-1978
19. Ausman K.D., Piner R., Lourie O., and Ruoff R.S. J. Phys. Chem. B 104 (2000) 8911-8915
20. Chen J., Hamon M.A., Hu H., Chen Y.S., Rao A.M., Eklund P.C., and Haddon R.C. Science 282 (1998) 95-98
21. Liu J., Rinzler A.G., Dai H., Hafner J.H., Bradley R., Boul P.J., Iverson T., Shelimov K., Huffman C.B., Rodriguez-Macias F., Shon Y., Lee T.R., Colbert D.T., and Smalley R.E.. Science 280 (1998) 1253-1256
22. Matarredona O., Rhoads H., Li Z., Harwell J.H., Balzano L., and Resasco D.E. J. Phys. Chem. B 107 (2003) 13357-14133