The Columbia University sub-micron charged particle beam

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 609, Issue 2-3, 2009, Pages 294-299

  Randers Pehrson, Gerhard ^a   Johnson, Gary W ^a   Marino, Stephen A ^a   Xu, Yanping ^a   Dymnikov, Alexander D ^b   Brenner, David J ^a  

^a Och Spine at New York Presbyterian Hospitals   (United States)

^b UNIVERSITY OF LOUISIANA AT LAFAYETTE   (United States)

Author keywords

Charged particle beam; Electrostatic; Microbeam; Quadrupole; Sub micron

Indexed keywords

BEAM SPOT; COLUMBIA UNIVERSITY; ELECTROSTATIC QUADRUPOLE; LENS DESIGNS; LENS SYSTEMS; MICRO BEAMS; QUADRUPOLES; RELATIVE STRENGTH; SUBMICRON; VOLTAGE STABILITY; WITHSTAND VOLTAGE;

CHARGED PARTICLES; ELECTRODES; ELECTROSTATICS; HELIUM; ION BOMBARDMENT; ION IMPLANTATION; LENSES; OPTICAL INSTRUMENTS; PARTICLE BEAM DYNAMICS; PARTICLE BEAMS;

ELECTROSTATIC LENSES;

EID: 71749120408     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2009.08.041     Document Type: Article

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