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Review of Scientific Instruments

Volumn 80, Issue 11, 2009, Pages

A diffraction-limited scanning system providing broad spectral range for laser scanning microscopy

(6) Yu, Jiun Yann a Liao, Chien Sheng a Zhuo, Zong Yan a Huang, Chen Han a,b Chui, Hsiang Chen b Chu, Shi Wei a

a NATIONAL TAIWAN UNIVERSITY (Taiwan)

b NATIONAL CHENG KUNG UNIVERSITY (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

BROAD SPECTRAL; CHROMATIC ABERRATION; DIFFRACTION LIMITED; GEOMETRICAL DESIGNS; GHOST REFLECTIONS; HIGH RESOLUTION; LASER SCANNING MICROSCOPY; METALLIC COATING; NEW DESIGN; OFF-AXIS; PRECISION FABRICATION; SCANNING AREA; SCANNING LASER MICROSCOPY; SCANNING SYSTEMS; SPECTRAL RANGE; SPHERICAL MIRROR; STREHL RATIO; TERA HERTZ;

ABERRATIONS; DIFFRACTION; GEOMETRICAL OPTICS; IMAGE RESOLUTION; IMAGING SYSTEMS; LASER APPLICATIONS; LASERS; MIRRORS; OPTICAL DESIGN; OPTICAL SYSTEMS;

SCANNING;

ARTICLE; CONFOCAL MICROSCOPY; INSTRUMENTATION; LIGHT RELATED PHENOMENA; RADIATION SCATTERING; REPRODUCIBILITY;

MICROSCOPY, CONFOCAL; OPTICAL PROCESSES; REPRODUCIBILITY OF RESULTS; SCATTERING, RADIATION;

EID: 71749110551 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.3254021 Document Type: Article

Times cited : (12)

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