A threshold photoelectron-photoion coincidence spectrometer with double velocity imaging using synchrotron radiation

Review of Scientific Instruments

Volumn 80, Issue 11, 2009, Pages

  Tang, Xiaofeng ^a   Zhou, Xiaoguo ^a   Niu, Mingli ^a   Liu, Shilin ^a   Sun, Jinda ^b   Shan, Xiaobin ^b   Liu, Fuyi ^b   Sheng, Liusi ^b  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

^b UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BEAM LINES; ENERGETIC ELECTRON; ENERGY RESOLUTIONS; IMAGING SPECTROMETERS; ION VELOCITY; MONOCHROMATIC SYNCHROTRON RADIATION; NATIONAL SYNCHROTRON RADIATION LABORATORY; OXYGEN ATOM; OXYGEN MOLECULE; PHOTOELECTRON-PHOTOION COINCIDENCE; PHOTOIONS; RESOLVING POWER; TIME-SLICED IMAGING; TRANSLATION ENERGY; VELOCITY IMAGING;

ARGON; ATOMS; ELECTRIC FIELDS; ELECTROMAGNETIC WAVES; IONS; LENSES; OXYGEN; PHOTOELECTRONS; PHOTOIONIZATION; PHOTONS; SPECTROMETERS; SPECTROMETRY; SYNCHROTRON RADIATION; SYNCHROTRONS;

PHOTOELECTRON SPECTROSCOPY;

ARGON; OXYGEN; XENON;

ARTICLE; CHEMISTRY; ELECTRON; INSTRUMENTATION; MASS SPECTROMETRY; METHODOLOGY; PHOTOCHEMISTRY; SYNCHROTRON; X RAY PHOTOELECTRON SPECTROSCOPY;

ARGON; ELECTRONS; MASS SPECTROMETRY; OXYGEN; PHOTOCHEMICAL PROCESSES; PHOTOELECTRON SPECTROSCOPY; SYNCHROTRONS; XENON;

EID: 71749101810     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3250872     Document Type: Article

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