Threshold photoelectron spectroscopy with velocity focusing: An ideal match for coincidence studies

International Journal of Mass Spectrometry

Volumn 219, Issue 3, 2002, Pages 381-389

  Baer, Tomas ^a   Li, Yue ^a  

^a University of North Carolina at Chapel Hill   (United States)

Author keywords

Photoelectron photoion coincidence; Photoelectron spectroscopy; Photoionization; Velocity focusing

Indexed keywords

ION; XENON;

ANALYTIC METHOD; ARTICLE; DEVICE; ELECTRIC FIELD; ELECTRON; ENERGY TRANSFER; IMAGING; IONIZATION; ISOELECTRIC FOCUSING; OPTICAL RESOLUTION; ULTRAVIOLET RADIATION; VACUUM; VELOCITY; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0036756777     PISSN: 13873806     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1387-3806(02)00694-2     Document Type: Article

References (36)

1. Dannacher J., Rosenstock H.M., Buff R., Parr A.C., Stockbauer R., Bombach R., Stadelmann J.P. Chem. Phys. 75:1983;23.
2. Das P.R., Nishimura T., Meisels G.G. J. Phys. Chem. 89:1985;2808.
3. Nishimura T., Zha Q., Meisels G.G. J. Chem. Phys. 87:1987;4589.
4. Norwood K., Ali A., Ng C.Y. J. Chem. Phys. 95:1991;8029.
5. Duffy L.M., Keister J.W., Baer T. J. Phys. Chem. 99:1995;17862.
6. Thissen R., Alcaraz C., Hepburn J.W., Vervloet M., Dutuit O. Int. J. Mass Spectrom. 199:2000;201.
7. Weitzel K.M., Mähnert J., Baumgärtel H. Ber. Bunsenges. Phys. Chem. 97:1993;134.
8. Weitzel K.M., Mähnert J. Z. Phys. Chem. 195:1996;181.
9. Li Y., Sztaray B., Baer T. J. Am. Chem. Soc. 123:2001;9388.
10. Baer T., Peatman W.B., Schlag E.W. Chem. Phys. Lett. 4:1969;243.
11. Hsieh T., Gilman J., Weiss M., Meisels G.G., Hierl P.M. Int. J. Mass Spectrom. Ion. Proc. 36:1980;317.
12. Spohr R., Guyon P.M., Chupka W.A., Berkowitz J. Rev. Sci. Instrum. 42:1971;1872.
13. Merkt F., Guyon P.M., Hepburn J.W. Chem. Phys. 173:1993;479.
14. Merkt F., Guyon P.M. J. Chem. Phys. 99:1993;3400.
15. Jarvis G.K., Song Y., Ng C.Y. Rev. Sci. Instrum. 70:1999;2615.
16. Jarvis G.K., Weitzel K.M., Malow M., Baer T., Song Y., Ng C.Y. Phys. Chem. Chem. Phys. 1:1999;5259.
17. Jarvis G.K., Weitzel K.M., Malow M., Baer T., Song Y., Ng C.Y. Rev. Sci. Instrum. 70:1999;3892.
18. Hall R.I., Dawber G., McConkey A., MacDonald M.A., King G.C. Phys. Rev. Lett. 68:1992;2751.
19. Hochlaf M., Kjeldsen H., Penent F., Hall R.I., Lablanquie P., Lavollee M., Eland J.H.D. Can. J. Phys. 74:1996;856.
20. Chandler D.W., Janssen M.H.M., Stolte S., Stickland R.N., Thoman J.W., Parker D.H. J. Phys. Chem. 94:1990;4839.
21. Chandler D.W., Parker D.H. Adv. Photochem. 25:1999;59.
22. D.A. Dahl, SIMION 3D Version 6.0, Ref Type: Computer Program, Scientific Instrument Services Inc., NJ, 1995.
23. Cooper D.r., Cubric D., Thompson D.B., Bolognesi P., Lopes M.C.A., King G.C. J. Electron Spectrosc. Relat. Phenom. 112:2000;129.
24. Gellender M.E., Baker A.D. Int. J. Mass Spectrom. Ion. Phys. 17:1975;1.
25. T. Baer, in: M.T. Bowers (Ed.), Gas Phase Ion Chemistry, Academic Press, New York, 1979, pp. 153-196.
26. Weitzel K.M., Malow M., Jarvis G.K., Baer T., Song Y., Ng C.Y. J. Chem. Phys. 111:1999;8267.
27. Weitzel K.M., Jarvis G.K., Malow M., Baer T., Song Y., Ng C.Y. Phys. Rev. Lett. 86:2001;3526.
28. Song Y., Qian X.-M., Lau K.C., Ng C.Y. J. Chem. Phys. 115:2001;4095.
29. J.B. Pedley, R.D. Naylor, S.P. Kirby, Thermochemical Data of Organic Compounds, Chapman and Hall, London, 1986.
30. D.D. Wagman, W.H.E. Evans, V.B. Parker, R.H. Schum, I. Halow, S.M. Mailey, K.L. Churney, R.L. Nuttall, The NBS Tables of Chemical Thermodynamic Properties, J. Phys. Chem. Ref. Data 11 (Suppl. 2), US Government Printing Office, NSRDS, Washington, 1982.
31. Walter K., Weinkauf R., Boesl U., Schlag E.W. J. Chem. Phys. 89:1988;1914.
32. Guyon P.M., Baer T., Ferreira L.F.A., Nenner I., Tabche-Fouhaile A., Botter R., Govers T.R. J. Phys. B: Atom. Molec. Phys. 11:1978;L141.
33. Davies J.A., LeClaire J.E., Continetti R.E., Hayden C.C. J. Chem. Phys. 111:1999;1.
34. Davies J.A., Continetti R.E., Chandler D.W., Hayden C.C. Phys. Rev. Lett. 84:2000;5983.
35. Lafosse A., Lebech M., Brenot J.C., Guyon P.M., Jagutzki O., Spielberger L., Vervloet M., Houver J.C., Dowek D. Phys. Rev. Lett. 84:2000;5987.
36. Tsai B.P., Baer T., Horowitz M.L. Rev. Sci. Instrum. 45:1974;494.