Residual stress measurement of an EB-PVD Y2O3-ZrO2 thermal barrier coating by micro-Raman spectroscopy

Surface and Coatings Technology

Volumn 204, Issue 5, 2009, Pages 657-660

  Tanaka, M ^a   Kitazawa, R ^a   Tomimatsu, T ^a   Liu, Y F ^a   Kagawa, Y ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

Piezo spectroscopic coefficient; Raman spectroscopy; Stress measurement; Thermal barrier coating; Y2O3 ZrO2

Indexed keywords

BULK STRESS; CONSTANT STRESS; FREE-EDGE EFFECTS; MICRO RAMAN SPECTROSCOPY; PIEZO-SPECTROSCOPIC COEFFICIENT; RESIDUAL STRESS DISTRIBUTIONS; SUPERALLOY SUBSTRATES; UNIAXIAL STRESS;

COATINGS; INSTRUMENTS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; RESIDUAL STRESSES; STRESS CONCENTRATION; THERMAL BARRIER COATINGS; ZIRCONIUM ALLOYS;

STRESS MEASUREMENT;

EID: 71749096139     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2009.08.042     Document Type: Article

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