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Volumn 165, Issue 1-2, 2009, Pages 64-66

A comparative study of SiO2 deposited by PECVD and thermal method as passivation for multicrystalline silicon solar cells

Author keywords

Silicon oxide; Solar cells; Surface passivation

Indexed keywords

OPEN CIRCUIT VOLTAGE; PASSIVATION; PLASMA CVD; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; REFRACTIVE INDEX; SILICA; SILICON SOLAR CELLS; SILICON WAFERS; SOLAR POWER GENERATION; THERMOOXIDATION; TITANIUM DIOXIDE;

EID: 71749092329     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2009.03.001     Document Type: Article
Times cited : (35)

References (8)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.