An introduction to biometric-completeness: The equivalence of matching and quality

IEEE 3rd International Conference on Biometrics: Theory, Applications and Systems, BTAS 2009

Volumn , Issue , 2009, Pages

  Phillips, P Jonathon ^a   Beveridge, J Ross ^b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b Colorado State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIOMETRIC RECOGNITION; BIOMETRIC SYSTEMS; IDENTIFICATION PROBLEM; QUALITY ASSESSMENT; QUALITY MEASURES; VERIFICATION ALGORITHMS;

PROBLEM SOLVING;

BIOMETRICS;

EID: 71749087726     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/BTAS.2009.5339055     Document Type: Conference Paper

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