Predicting biometric system failure

Proceedings of the 2005 IEEE International Conference on Computational Intelligence for Homeland Security and Personal Safety, CIHSPS 2005

Volumn 2005, Issue , 2005, Pages 57-64

  Li, Weiliang ^a,b   Gao, Xiang ^b   Boult, Terrance E ^c,d  

^a LEHIGH UNIVERSITY   (United States)

^b SIEMENS CORPORATE RESEARCH   (United States)

^c U Colorado   (United States)

^d Securics Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIOMETRIC SYSTEMS; FALSE ALARM RATE; POST-RECOGNITION ANALYSIS TECHNIQUES (PRAT); SYSTEM PERFORMANCE;

ALGORITHMS; CLASSIFICATION (OF INFORMATION); COMPUTER SYSTEM RECOVERY; FACE RECOGNITION; LEARNING SYSTEMS; OBJECT RECOGNITION;

PATTERN RECOGNITION SYSTEMS;

EID: 33745507165     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CIHSPS.2005.1500612     Document Type: Conference Paper

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