Antireflection subwavelength structures analyzed by using the finite difference time domain method

Optik

Volumn 120, Issue 16, 2009, Pages 814-817

  Ting, Chia Jen ^a,b   Chen, Chi Feng ^c   Chou, C P ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^b INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE   (Taiwan)

^c NATIONAL CENTRAL UNIVERSITY   (Taiwan)

Author keywords

Antireflection; Fresnel reflection finite difference time domain; Nanostructure; Subwavelength structure

Indexed keywords

ANTI-REFLECTION; CONICAL STRUCTURES; DIFFERENT STRUCTURE; FDTD METHOD; FINITE DIFFERENCE TIME DOMAINS; FRESNEL REFLECTIONS; PYRAMIDAL SHAPE; PYRAMIDAL STRUCTURES; SUB-WAVELENGTH STRUCTURES; VISIBLE LIGHT;

FINITE DIFFERENCE TIME DOMAIN METHOD; NANOSTRUCTURES; PRESSURE DROP; REACTIVE ION ETCHING; REFLECTION; SURFACE STRUCTURE;

ASPECT RATIO;

EID: 71249149622     PISSN: 00304026     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijleo.2008.03.011     Document Type: Article

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