Cu-induced poly-Si/SiO2/α-Si multilayer film with high reflectivity across the whole visible band

Physica Status Solidi - Rapid Research Letters

Volumn 3, Issue 2-3, 2009, Pages 82-84

  Zhang, Wenyan ^a   Li, Dejie ^a   Wang, Jian ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL GRAIN SIZE; DC SPUTTERING; HIGH REFLECTIVITY; HIGH REFRACTIVE INDEX; LOW REFRACTIVE INDEX; LUMINESCENT EFFICIENCY; PLASMA DISPLAY PANEL; POLY-SI; ROOM TEMPERATURE; VISIBLE BAND;

CRYSTALLIZATION; LIGHT MEASUREMENT; LIGHT REFRACTION; MULTILAYER FILMS; MULTILAYERS; PLASMA DISPLAY DEVICES; POLYSILICON; REFRACTIVE INDEX; REFRACTOMETERS; SILICON COMPOUNDS;

REFLECTION;

EID: 71149112351     PISSN: 18626254     EISSN: 18626270     Source Type: Journal    
DOI: 10.1002/pssr.200903003     Document Type: Article

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