Frequency-temperature response of Pb(Zr0.65-xCexTi0.35)O3 ferroelectric ceramics: Structural and dielectric studies

Physica B: Condensed Matter

Volumn 404, Issue 21, 2009, Pages 4111-4116

  Tiwari, Balgovind ^a   Choudhary, R N P ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY   (India)

Author keywords

Ac conductivity; Dielectric properties; Polycrystalline; Scanning electron microscopy; Solid state reaction; X ray diffraction

Indexed keywords

AC CONDUCTIVITY; CE CONCENTRATION; DIELECTRIC CONSTANTS; DIELECTRIC STUDIES; FREQUENCY-TEMPERATURE RESPONSE; GRAIN SIZE; HIGH TEMPERATURE SOLID-STATE REACTION; MICROSTRUCTURAL ANALYSIS; MICROSTRUCTURAL PROPERTIES; POLYCRYSTALLINE; POLYCRYSTALLINE SAMPLES; ROOM TEMPERATURE; SEM; XRD STUDIES;

CERIUM; DIELECTRIC PROPERTIES; DIFFRACTION; FERROELECTRIC CERAMICS; FREQUENCY RESPONSE; LEAD; SCANNING; SCANNING ELECTRON MICROSCOPY; STRUCTURAL CERAMICS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; ZIRCONIUM;

CERIUM COMPOUNDS;

EID: 71149104703     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2009.07.171     Document Type: Article

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