|
Volumn 6, Issue 7, 2009, Pages 1685-1688
|
Study and characterization of porous germanium for radiometric measurements
|
Author keywords
[No Author keywords available]
|
Indexed keywords
CRYSTALLOGRAPHIC ORIENTATIONS;
ELECTRICAL CURRENT;
FRONT SURFACES;
GA-DOPED;
INCIDENT RADIATION;
OPERATION TIME;
OPERATIONAL PARAMETERS;
P-TYPE;
POROUS SAMPLES;
POROUS STRUCTURES;
RADIOMETRIC MEASUREMENTS;
REFLECTION COEFFICIENTS;
SINGLE-CRYSTAL SUBSTRATES;
SPECTRAL RANGE;
WAVELENGTH REGIONS;
GALLIUM ALLOYS;
GERMANIUM;
PHOTODIODES;
RADIOMETRY;
REFLECTION;
CRYSTAL ORIENTATION;
|
EID: 70949089780
PISSN: 18626351
EISSN: None
Source Type: Journal
DOI: 10.1002/pssc.200881099 Document Type: Conference Paper |
Times cited : (5)
|
References (7)
|