-
1
-
-
71549132455
-
-
Marcel Dekker, New-York, USA, Correlation Pattern Recognition: An Optimum Approach
-
A. Mahalanobis, Image Recognition and Classification (Marcel Dekker, New-York, USA, 2002) Correlation Pattern Recognition: An Optimum Approach.
-
(2002)
Image Recognition and Classification
-
-
Mahalanobis, A.1
-
2
-
-
0032002695
-
Three dimensional electro-optical correlation
-
J. Rosen, "Three dimensional electro-optical correlation," J. Opt. Soc. Am. A, vol. 15, pp. 430-436,. 1998.
-
(1998)
J. Opt. Soc. Am. A
, vol.15
, pp. 430-436
-
-
Rosen, J.1
-
3
-
-
0002425705
-
Digital image formation from electronically detected holograms
-
J. W. Goodman and R. W. Lawrence, "Digital image formation from electronically detected holograms," Appl. Phy. Lett., vol. 11, pp. 77-79, 1967.
-
(1967)
Appl. Phy. Lett.
, vol.11
, pp. 77-79
-
-
Goodman, J.W.1
Lawrence, R.W.2
-
4
-
-
0001046849
-
Three-dimensional object recognition by use of digital holography
-
B. Javidi and E. Tajahuerce, "Three-dimensional object recognition by use of digital holography," Opt. Lett., vol. 25, pp. 610-612, 2000.
-
(2000)
Opt. Lett.
, vol.25
, pp. 610-612
-
-
Javidi, B.1
Tajahuerce, E.2
-
5
-
-
13144277607
-
Three-dimensional-object recognition by use of single-exposure on-axis digital holography
-
B. Javidi and D. Kim, "Three-dimensional-object recognition by use of single-exposure on-axis digital holography," Opt. Lett., vol. 30, pp. 236-238, 2005.
-
(2005)
Opt. Lett.
, vol.30
, pp. 236-238
-
-
Javidi, B.1
Kim, D.2
-
6
-
-
0032632458
-
-
X. Niu, N. Jakatdar, J. Bao, C. Spanos and S. Yedur, Pro. SPIE, vol. 3677, pp. 159, 1999.
-
(1999)
Pro. SPIE
, vol.3677
, pp. 159
-
-
Niu, X.1
Jakatdar, N.2
Bao, J.3
Spanos, C.4
Yedur, S.5
-
7
-
-
0040158811
-
Normal-incidence spectroscopic ellipsometry for critical dimension monitoring
-
DOI 10.1063/1.1378807
-
H. Huang and F. Terry, "Normal incidence spectroscopic ellipsometry for critical dimension monitoring," App. Phy. Lett, vol. 78, pp. 3983-3985, 2001. (Pubitemid 33599482)
-
(2001)
Applied Physics Letters
, vol.78
, Issue.25
, pp. 3983-3985
-
-
Huang, H.-T.1
Kong, W.2
Terry Jr., F.L.3
-
8
-
-
33749122289
-
Mathematical modeling of indirect measurements in scatterometry
-
H. Gross et al, "Mathematical modeling of indirect measurements in scatterometry," Measurement, vol. 39, pp. 782-794, 2006.
-
(2006)
Measurement
, vol.39
, pp. 782-794
-
-
Gross, H.1
-
9
-
-
0029307028
-
Formulation for stable and efficient implementation of the rigorous coupled-wave analysis of binary gratings
-
M. G. Moharam, E. B. Grann, D. A. Pommet, and T. K. Gaylord, "Formulation for stable and efficient implementation of the rigorous coupled-wave analysis of binary gratings," J. Opt. Soc. Am. A, 12, pp. 1068-1076, 1995.
-
(1995)
J. Opt. Soc. Am. A
, vol.12
, pp. 1068-1076
-
-
Moharam, M.G.1
Grann, E.B.2
Pommet, D.A.3
Gaylord, T.K.4
-
10
-
-
0035336421
-
Specular spectroscopic scatterometry
-
X. Niu, N. Jakatdar, J. Bao, and C. J. Spanos, "Specular Spectroscopic Scatterometry," IEEE Transactions on Semiconductor Manufacturing, vol. 14, no. 2, pp. 97-111, 2001.
-
(2001)
IEEE Transactions on Semiconductor Manufacturing
, vol.14
, Issue.2
, pp. 97-111
-
-
Niu, X.1
Jakatdar, N.2
Bao, J.3
Spanos, C.J.4
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