Enhancing spatial-resolution with detectors of special-shaped pixels

Guangxue Jingmi Gongcheng/Optics and Precision Engineering

Volumn 17, Issue 10, 2009, Pages 2620-2627

  Liu, Yan Yan ^a,b   Zhang, Xin ^a   Xu, Zheng Ping ^a,b   Zhang, Jian Ping ^a   Wang, Ling Jie ^a   Wang, De Jiang ^a  

^a CHANGCHUN INSTITUTE OF OPTICS   (China)

^b UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

Author keywords

Detector of special shaped pixel; Pixel subdivision; Super resolution imaging

Indexed keywords

ACTIVE AREA; CONVENTIONAL IMAGING; GRAY SCALE; IMAGING METHOD; IR LENS; LINEAR ARRAYS; MATRIX; OBJECTIVE SPACE; OVERSAMPLING TECHNOLOGY; SPATIAL RESOLUTION; SPECIFIC INFORMATION; SUPER RESOLUTION; SUPER RESOLUTION IMAGING;

DETECTORS; FREQUENCY RESPONSE; IMAGE RECONSTRUCTION; OPTICAL COLLIMATORS; OPTICAL RESOLVING POWER; OPTICAL SYSTEMS; OPTOELECTRONIC DEVICES; SIGNAL PROCESSING;

PIXELS;

EID: 70849120402     PISSN: 1004924X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (21)

1. Harris J L. Diffraction and resolving power [J]. Journal of the Optical Society of America, 1964, 54(7):931-936.
2. Goodman J W. Introduction to Fourier Optics [M]. 2nd ed. New York: McGraw- Hill, 1996.
3. Tsai R Y, Huang T S. Multipleframe image restoration and registration[C]. Advances in Computer Vision and Image Processing. Greenwich, CY: JAI Press Inc. , 1984:317-339.
4. Driggers R G, Krapels K, Young S. The Meaning of Super-Resolution [C]. Proc. SPIE, 2005, 5784:103-105.
5. Komatsut, Aizawa K, Igarashi T, et al.. Signal-processing based method for acquiring very high resolution image with multiple cameras and its theoretical analysis [C]. Proc. Inst. Elec. Eng. , 1993, 140(1):19-25.
6. Friedenberg A. Microscan in infrared staring systems [J]. Optical Engineering, 1997, 36(7): 1745-1749
7. Wang X R, Hu F M, Zhang J Q, et al.. Research on the FPA imaging character based on microscanning[J]. Journal of Xidian University, 2005, 32(3):392-397. (in Chinese)
8. Fanning J D, Reynolds J P. Target identification performance of superresolution versus dither[C]. Proc. SPIE, 2008, 69410N, 1-12.
9. Jin W Q, Chen Y N, Wang X, et al.. Scanning type sub-pixel thermal imaging algorithm taking account of detector filling rate and micro-scanning contraposition bias[J]. J. Infrared Millim. Waves, 2008, 27(4):308-312. (in Chinese)
10. Yang H, Guo Y, Fu R M. Study on field butting of TDICCD[J]. Optical Technique, 2003, 29(2):226-228. (in Chinese)
11. Xu Zh H, Feng H J. Overview of research approaches for ultrahigh-resolution optoelectronic imaging[J]. Infrared and Laser Engineering, 2006, 35(4):456-463. (in Chinese)
12. Zhu J J, Wen D Sh, Qiao W D, et al.. Method for composing two images of TDICCD sub-pixel camera [J]. Acta Optica Sinia, 2007, 36(5):933-936. (in Chinese)
13. Zhang Zh, Xia D Sh, Sun Q S. Wavelet tnterpolation and Filtering of subpixel remote sensing image[J]. Journal of Nanjing University of Science and Technology (Natural Science), 2008, 32(2):195-198. (in Chinese)
14. http://www.c-cnc.com/dz/news/news.asp?id=22091[OL].
15. Mait J N, Athale R, Gracht J V D. Evolutionary paths in imaging and recent trends[J]. Optics Express, 2003, 11(18):2093-2101.
16. Gerald C. Holst. Electro-Optical Imaging System Performance[M]. 3rd ed. Bellingham Washington: SPIE Press, 2005: 83.
17. Goodman J W. Introduction to Fourier Optics [M]. 2nd ed. New York: McGraw- Hill, 1996.
18. Yu D Y, Tan H Y. Engineering Optics [M]. 2nd ed. Beijing:China Machine Press, 2006:198. (in Chinese)
19. Vollmerhausen R H, Driggers R G. Analysis of Sampled Imaging Systems [M]. Bellingham, Washington: SPIE Process, 2000:34-36.
20. Hadar O, Boreman G D. Oversampling requirements for pixilated-imager systems[J]. Optical Engineering, 1999, 38(5):782-785.
21. Che Sh L, Wen D Sh. The space resolution of dynamic subpixel imaging system[J]. Acta Photonica Sinica, 2001, 30(11):1418-1420. (in Chinese)