The z value dependence of photoluminescence in Eu2+-doped β-SiAlON (Si6-zAlzOzN8-z) with 1 ≤ z ≤ 4

Journal of Alloys and Compounds

Volumn 489, Issue 1, 2010, Pages 157-161

  Zhu, X W ^a   Masubuchi, Y ^a   Motohashi, T ^a   Kikkawa, S ^a  

^a HOKKAIDO UNIVERSITY   (Japan)

Author keywords

Luminescent materials; Optical properties; Powder processing; SiAlON; X ray diffraction (XRD)

Indexed keywords

BROAD BANDS; EMISSION BANDS; EMISSION SPECTRUMS; GAS-PRESSURE SINTERING; GREEN EMISSIONS; LUMINESCENT MATERIAL; LUMINESCENT MATERIALS; POWDER PROCESSING; ULTRA VIOLET EXCITATION; VIOLET EMISSION; WHITE EMISSIONS; Z VALUE;

DIFFRACTION; EMISSION SPECTROSCOPY; EUROPIUM; EUROPIUM COMPOUNDS; LEAD COMPOUNDS; LUMINESCENCE; MATERIALS PROPERTIES; SINTERING; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

OPTICAL PROPERTIES;

EID: 70649093864     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2009.09.042     Document Type: Article

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