Bayesian validation of computer models

Technometrics

Volumn 51, Issue 4, 2009, Pages 439-451

  Wang, Shuchun ^a   Tsui, Kwok Leung ^a   Chen, Wei ^b  

^a Georgia Institute of Technology   (United States)

^b Northwestern University   (United States)

Author keywords

Bayesian; Computer model; Gaussian process; Model bias; Model validation; Physical experiments

Indexed keywords

BAYESIAN; COMPUTER MODELS; GAUSSIAN PROCESS MODELS; MODEL VALIDATION; PHYSICAL EXPERIMENTS;

BAYESIAN NETWORKS; EXPERIMENTS; GAUSSIAN DISTRIBUTION; GAUSSIAN NOISE (ELECTRONIC);

COMPUTER CRIME;

EID: 70549096875     PISSN: 00401706     EISSN: None     Source Type: Journal    
DOI: 10.1198/TECH.2009.07011     Document Type: Article

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