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Volumn , Issue , 2006, Pages 269-271

A chemical and thermal resistant wafer bonding adhesive simplifying wafer backside processing

Author keywords

Adhesive; Bonding; Etching; Mounting; Thinning; Waferbond

Indexed keywords

BONDING ADHESIVE; HIGH RESISTANCE; LOW TEMPERATURES; PROCESS CONDITION; PROCESS LINE; STRONG ACIDS; THINNING; WAFERBOND;

EID: 70549086817     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (15)

References (11)
  • 1
    • 84877977200 scopus 로고    scopus 로고
    • High temperature resistant adhesive for wafer thinning and backside processing
    • May
    • J. Moore, A. Smith, D. Nguyen, and S. Kulkarni, High Temperature Resistant Adhesive for Wafer Thinning and Backside Processing, 2004 GaAs MANTECH, Technical Digest, pp. 175-178, May 2004.
    • (2004) 2004 GaAs MANTECH Technical Digest , pp. 175-178
    • Moore, J.1    Smith, A.2    Nguyen, D.3    Kulkarni, S.4
  • 2
    • 33645543951 scopus 로고    scopus 로고
    • A new alternative for temporary wafer mounting
    • April
    • Mould, and J. Moore, A New Alternative for Temporary Wafer Mounting, GaAs MANTECH, Technical Digest, pp.109-112, April 2002.
    • (2002) GaAs MANTECH Technical Digest , pp. 109-112
    • Mould1    Moore, J.2
  • 5
    • 84887439503 scopus 로고    scopus 로고
    • WaferBOND™ is a new spin-on adhesive for wafer process, part of a line of specialty materials provided
    • by, Inc. Rolla, MO
    • WaferBOND™ is a new spin-on adhesive for wafer process, part of a line of specialty materials provided by Brewer Science, Inc., Rolla, MO. 2006.
    • (2006) Brewer Science
  • 7
    • 84887353491 scopus 로고    scopus 로고
    • GaAs surface preparation for thin films deposition using sodium hypochlorite
    • May
    • C. Becker, B. Ng, GaAs Surface Preparation for Thin Films Deposition Using Sodium Hypochlorite, 2004 CS MANTECH Technical Digest, pp. 129-132, May 2003.
    • (2003) 2004 CS MANTECH Technical Digest , pp. 129-132
    • Becker, C.1    Ng, B.2
  • 8
    • 0041557455 scopus 로고    scopus 로고
    • Through-substrate via etching and cleaning for high volume production demands
    • April
    • K. Costello, C. Wasson, T. Daily, J. Moore, Through-Substrate Via Etching and Cleaning for High Volume Production Demands, 2002 GaAs Mantech Technical Digest, pp. 117-120, April 2002.
    • (2002) 2002 GaAs Mantech Technical Digest , pp. 117-120
    • Costello, K.1    Wasson, C.2    Daily, T.3    Moore, J.4
  • 9
    • 84887335725 scopus 로고    scopus 로고
    • Removal of gold impregnated post-etch residue from front and backside vias in a single process
    • April
    • J. Moore, S. Luna, T. Rivers, B. Howell, C. Becker, Removal of Gold Impregnated Post-Etch Residue from Front and Backside Vias in a Single Process, 2005 CS MANTECH Technical Digest, pp. 273-276, April 2005.
    • (2005) 2005 CS MANTECH Technical Digest , pp. 273-276
    • Moore, J.1    Luna, S.2    Rivers, T.3    Howell, B.4    Becker, C.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.