Extended depth of focus in a particle field measurement using a single-shot digital hologram

Applied Physics Letters

Volumn 95, Issue 20, 2009, Pages

  Chen, Wen ^a   Quan, Chenggen ^a   Tay, Cho Jui ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

CANNY ALGORITHM; DEPTH MAP; DEPTH OF FOCUS; DIGITAL HOLOGRAMS; ENTROPY METHODS; EXTENDED DEPTH OF FOCUS; FIELD MEASUREMENT; FOCAL PLANE; SINGLE-SHOT; WAVELET MODULUS MAXIMA;

ELECTRIC FIELD MEASUREMENT; ELECTRIC MEASURING INSTRUMENTS; HOLOGRAMS; IMAGE PROCESSING; SPECIAL EFFECTS; THREE DIMENSIONAL;

EDGE DETECTION;

EID: 70450260671     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3263141     Document Type: Article

References (21)

1. D. Gabor, Nature (London) 0028-0836 161, 777 (1948). 10.1038/161777a0
2. J. W. Goodman and R. W. Lawrence, Appl. Phys. Lett. 0003-6951 11, 77 (1967). 10.1063/1.1755043
3. T. Kreis, Handbook of Holographic Interferometry: Optical and Digital Methods (Wiley-VCH, Weinheim, 2005).
4. I. Yamaguchi and T. Zhang, Opt. Lett. 0146-9592 22, 1268 (1997). 10.1364/OL.22.001268
5. Y. Awatsuji, M. Sasada, and T. Kubota, Appl. Phys. Lett. 0003-6951 85, 1069 (2004). 10.1063/1.1777796
6. T. Latychevskaia and H. W. Fink, Phys. Rev. Lett. 0031-9007 98, 233901 (2007). 10.1103/PhysRevLett.98.233901 (Pubitemid 47139819)
7. W. Chen, C. Quan, and C. J. Tay, Appl. Opt. 0003-6935 47, 2874 (2008). 10.1364/AO.47.002874
8. Y. Zhi, W. Qu, D. Liu, Z. Luan, and L. Liu, Appl. Phys. Lett. 0003-6951 89, 112912 (2006). 10.1063/1.2345277 (Pubitemid 44396623)
9. D. G. Papazoglou and S. Tzortzakis, Appl. Phys. Lett. 0003-6951 93, 041120 (2008). 10.1063/1.2968190
10. Y. Yang and B. S. Kang, Appl. Opt. 0003-6935 47, 5953 (2008). 10.1364/AO.47.005953
11. F. Soulez, L. Denis, E. Thíbaut, C. Fournier, and C. Goepfert, J. Opt. Soc. Am. A Opt. Image Sci. Vis 1084-7529 24, 3708 (2007). 10.1364/JOSAA.24.003708 (Pubitemid 351325139)
12. X. Wu, G. Gŕhan, S. M. Cluzel, L. Chen, and K. Cen, Opt. Lett. 0146-9592 34, 857 (2009). 10.1364/OL.34.000857
13. S. Cotmellec, D. Lebrun, and C. Ozkul, J. Opt. Soc. Am. A Opt. Image Sci. Vis 1084-7529 19, 1537 (2002). 10.1364/JOSAA.19.001537
14. J. Sheng, E. Malkiel, and J. Katz, Appl. Opt. 0003-6935 45, 3893 (2006). 10.1364/AO.45.003893 (Pubitemid 44072979)
15. S. Kim and S. J. Lee, J. Micromech. Microeng. 0960-1317 17, 2157 (2007). 10.1088/0960-1317/17/10/030 (Pubitemid 47469925)
16. M. Antkowiak, N. Callens, C. Yourassowsky, and F. Dubois, Opt. Lett. 0146-9592 33, 1626 (2008). 10.1364/OL.33.001626
17. J. W. Goodman, Introduction to Fourier Optics, 2nd ed. (McGraw-Hill, New York, 1996).
18. C. Liu, Z. Liu, F. Bo, Y. Wang, and J. Zhu, Appl. Phys. Lett. 0003-6951 81, 3143 (2002). 10.1063/1.1517402 (Pubitemid 35360518)
19. J. Gillespie and R. A. King, Pattern Recognit. Lett. 9, 19 (1989). 10.1016/0167-8655(89)90024-X 0167-8655
20. S. Mallat and S. Zhong, IEEE Trans. Pattern Anal. Mach. Intell. 0162-8828 14, 710 (1992). 10.1109/34.142909
21. J. Canny, IEEE Trans. Pattern Anal. Mach. Intell. 0162-8828 8, 679 (1986). 10.1109/TPAMI.1986.4767851