Molecular dynamics simulation of helium and oxygen diffusion in UO2 ± x

Journal of Nuclear Materials

Volumn 395, Issue 1-3, 2009, Pages 131-139

  Govers, K ^a,b   Lemehov, S ^b   Hou, M ^a   Verwerft, M ^b  

^a UNIVERSITÉ LIBRE DE BRUXELLES   (Belgium)

^b BELGIAN NUCLEAR RESEARCH CENTRE   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC-SCALE SIMULATIONS; DIFFUSION REGIMES; EMPIRICAL POTENTIALS; EXTRINSIC DEFECTS; HIGHER TEMPERATURES; LOW-ACTIVATION ENERGY; MIGRATION MECHANISMS; MIGRATION PROCESS; MOLECULAR DYNAMICS SIMULATIONS; NUDGED ELASTIC BAND; OXYGEN DEFECT; OXYGEN DIFFUSION; STRUCTURAL DEFECT; SYSTEM TEMPERATURE;

ACTIVATION ENERGY; DEFECTS; DIFFUSION IN GASES; HELIUM; MOLECULAR DYNAMICS; MOLECULAR OXYGEN; STOICHIOMETRY; TRANSURANIUM ELEMENTS; URANIUM; URANIUM DIOXIDE; VACANCIES;

OXYGEN VACANCIES;

EID: 70450245202     PISSN: 00223115     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnucmat.2009.10.043     Document Type: Article

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