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Volumn , Issue , 2009, Pages

Characterization of oxidation of electroplated Sn for advanced flip-chip bonding

Author keywords

Electroplated Sn; Flip chip; Oxidation; Oxide removal

Indexed keywords

ELECTROPLATED SN; FLIP CHIP; FLIP-CHIP BONDING; FLUX-LESS SOLDERING; OXIDE REMOVAL; OXIDE THICKNESS; PB FREE SOLDERS; ROOM TEMPERATURE; TEMPERATURE RAMP; XPS;

EID: 70449920920     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (7)

References (8)
  • 3
    • 0035953770 scopus 로고    scopus 로고
    • 2 by oxide electrolyte e.m.f. measurements, Thermochimica Acta, 371, pp. 95-101, 2001.
    • 2 by oxide electrolyte e.m.f. measurements", Thermochimica Acta, Vol. 371, pp. 95-101, 2001.
  • 4
    • 39849094891 scopus 로고    scopus 로고
    • Effect of oxidation on indium solderability
    • J. Kim, H. Schoeller, J. Cho, and S. Park, "Effect of oxidation on indium solderability", J. Electron. Mater., Vol. 37, pp. 483-489, 2008.
    • (2008) J. Electron. Mater , vol.37 , pp. 483-489
    • Kim, J.1    Schoeller, H.2    Cho, J.3    Park, S.4
  • 6
    • 1342283786 scopus 로고    scopus 로고
    • Aorrosion inhibition by thiol-derived SAMs for enhanced wire bonding on Cu surface
    • C.M. Whelan, M. Kinsella, H.M. Ho, and K. Maex, "Aorrosion inhibition by thiol-derived SAMs for enhanced wire bonding on Cu surface", J. Electro-chem. Soc., Vol. 151, pp. B33-B38, 2004.
    • (2004) J. Electro-chem. Soc , vol.151
    • Whelan, C.M.1    Kinsella, M.2    Ho, H.M.3    Maex, K.4
  • 7
    • 0028767258 scopus 로고
    • Mossbauer spectroscopy investigations of the oxidation of α-Sn and β-Sn types of structure
    • SK. Peneva, NS. Neykov, V. Rusanov, and DD. Chakarov, "Mossbauer spectroscopy investigations of the oxidation of α-Sn and β-Sn types of structure", J. Phys.:Condens. Mater., Vol. 6, pp. 2083-2094, 1994.
    • (1994) J. Phys.:Condens. Mater , vol.6 , pp. 2083-2094
    • Peneva, S.K.1    Neykov, N.S.2    Rusanov, V.3    Chakarov, D.D.4
  • 8
    • 77649109091 scopus 로고    scopus 로고
    • Low Temperature Direct Cu-Cu Immersion Bonding for 3D Integration
    • to be published in, April 13-17
    • R. Agarwal, W. Ruythooren, "Low Temperature Direct Cu-Cu Immersion Bonding for 3D Integration", to be published in MRS spring meeting, April 13-17, 2009.
    • (2009) MRS spring meeting
    • Agarwal, R.1    Ruythooren, W.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.