Discrimination of thioarsenites and thioarsenates by X-ray absorption spectroscopy

Analytical Chemistry

Volumn 81, Issue 20, 2009, Pages 8318-8326

  Suess, Elke ^a,b   Scheinost, Andreas C ^c,d   Bostick, Benjamin C ^e   Merkel, Broder J ^b   Wallschlaeger, Dirk ^f   Planer Friedrich, Britta ^b  

^a UNIVERSITY OF BAYREUTH   (Germany)

^b TU BERGAKADEMIE FREIBERG   (Germany)

^c INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

^d EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^e HB 6105 Fairchild Hall ^*  (United States)

^f TRENT UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

BOND DISTANCE; EDGE ENERGY; SULFIDIC WATERS; SULFUR ATOMS;

ABSORPTION; ANALYTICAL GEOCHEMISTRY; ARSENIC; ARSENIC COMPOUNDS; PRINCIPAL COMPONENT ANALYSIS; SULFUR; SULFUR COMPOUNDS; X RAY ABSORPTION; X RAY ABSORPTION SPECTROSCOPY;

ABSORPTION SPECTROSCOPY;

ARSENIC ACID; ARSENIC TRIOXIDE; SULFUR;

ABSORPTION SPECTROSCOPY; ACIDIFICATION; ARTICLE; CHEMICAL BOND; PH; PRINCIPAL COMPONENT ANALYSIS; ROENTGEN SPECTROSCOPY;

EID: 70449824288     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac901094b     Document Type: Article

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