메뉴 건너뛰기




Volumn , Issue , 2009, Pages 201-204

A test-bed designed to utilize Zhu's general sampling theorem to characterize power amplifiers

Author keywords

Component; Measurement system; Power amplifier; Zhu's general sampling theorem

Indexed keywords

ALTERNATIVE METHODS; COMPONENT; COMPONENT MEASUREMENT; DOWN CONVERTERS; FREQUENCY RANGES; INTERMEDIATE FREQUENCIES; LIMITED BANDWIDTH; NYQUIST RATE; OUTPUT SIGNAL; PERFORMANCE DATA; RF FRONT END; SAMPLING RATES; SAMPLING THEOREMS; TEST SETS; VECTOR SIGNAL ANALYZERS;

EID: 70449808162     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IMTC.2009.5168443     Document Type: Conference Paper
Times cited : (10)

References (12)
  • 3
    • 0030244856 scopus 로고    scopus 로고
    • Sampling requirements for Volterra system identification
    • W. A. Frank, "Sampling requirements for Volterra system identification," Signal Processing Letters, IEEE, vol. 3, pp. 266-268, 1996.
    • (1996) Signal Processing Letters, IEEE , vol.3 , pp. 266-268
    • Frank, W.A.1
  • 4
    • 34648833239 scopus 로고    scopus 로고
    • Implementation Considerations on the Use of Zhu's General Sampling Theorem for Characterization of Power Amplifiers
    • IEEE
    • D. Wisell and P. Händel, "Implementation Considerations on the Use of Zhu's General Sampling Theorem for Characterization of Power Amplifiers," in Instrumentation and Measurement Technology Conference Proceedings, 2007. IMTC 2007. IEEE, 2007, pp. 1-4.
    • (2007) Instrumentation and Measurement Technology Conference Proceedings, 2007. IMTC , pp. 1-4
    • Wisell, D.1    Händel, P.2
  • 5
    • 0003409584 scopus 로고    scopus 로고
    • Digital Signal Processing
    • New Jersey: Pearson Prentice hall
    • J. G. Proakis and D. G. Manolakis, Digital Signal Processing. Upper Sabble Riverm New Jersey: Pearson Prentice hall, 2007.
    • (2007) Upper Sabble Riverm
    • Proakis, J.G.1    Manolakis, D.G.2
  • 6
    • 84899049387 scopus 로고    scopus 로고
    • High dynamic range testbed for characterization of analogue-to-digital converters up to 500MSPS
    • Gdynia, Poland
    • N. Björsell, O. Andersen, and P. Händel, "High dynamic range testbed for characterization of analogue-to-digital converters up to 500MSPS," in 10th Workshop on ADC modelling and testing, Gdynia, Poland, 2005, pp. 601-604.
    • (2005) 10th Workshop on ADC modelling and testing , pp. 601-604
    • Björsell, N.1    Andersen, O.2    Händel, P.3
  • 7
    • 70449930070 scopus 로고    scopus 로고
    • Wideband Characterization of Power Amplifiers Using Undersampling
    • press
    • O. Andersen et al, "Wideband Characterization of Power Amplifiers Using Undersampling", MTT-S, IEEE, Boston, 2009, in press.
    • (2009) MTT-S, IEEE, Boston
    • Andersen, O.1
  • 8
    • 34648813017 scopus 로고    scopus 로고
    • An automatic digital modulation classifier for measurement on Telecommunication networks
    • Oct
    • L. De Vito, D. Grimaldi, S. Rapuano, "An automatic digital modulation classifier for measurement on Telecommunication networks", IEEE Trans. on Instrum. and Meas., vol. 56, no. 4, pp. 1711-1720, Oct. 2007.
    • (2007) IEEE Trans. on Instrum. and Meas , vol.56 , Issue.4 , pp. 1711-1720
    • De Vito, L.1    Grimaldi, D.2    Rapuano, S.3
  • 10
    • 70449950275 scopus 로고    scopus 로고
    • Automatic signal recognition for a flexible spectrum management
    • unpublished
    • N. Björsell, P. Daponte, L. De Vito, S. Rapuano "Automatic signal recognition for a flexible spectrum management", unpublished.
    • Björsell, N.1    Daponte, P.2    De Vito, L.3    Rapuano, S.4
  • 11
    • 0038159360 scopus 로고    scopus 로고
    • A baseband time domain measurement system for dynamic characterization of power amplifiers with high dynamic range over large bandwidths
    • D. Wisell, "A baseband time domain measurement system for dynamic characterization of power amplifiers with high dynamic range over large bandwidths," in Instrumentation and Measurement Technology Conference, 2003. IMTC '03. Proceedings of the 20th IEEE, 2003, pp. 1177-1180 vol. 2.
    • (2003) Instrumentation and Measurement Technology Conference, 2003. IMTC '03. Proceedings of the 20th IEEE , vol.2 , pp. 1177-1180
    • Wisell, D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.