High dynamic range test-bed for characterization of analog-to-digital converters up to 500 MSPS

14th Symposium on New Technologies in Measurement and Instrumentation and 10th Workshop on ADC Modelling and Testing

Volumn , Issue , 2005, Pages 601-604

  Bjorsell N ^a   Andersen, O ^b   Handel P ^c  

^a UNIVERSITY OF GÄVLE   (Sweden)

^b ERICSSON RESEARCH   (Sweden)

^c ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG TO DIGITAL CONVERSION; INSTRUMENTS;

ANALOG TO DIGITAL CONVERTERS; AND FILTERS; COMMERCIAL INSTRUMENTS; COST-EFFICIENT; DYNAMIC PERFORMANCE; HIGH DYNAMIC RANGE;

MEASUREMENTS;

EID: 84899049387     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)

1. Travis, B., "Remystifying ADCs". EDN, Vol. 42, No 21, pp. 87-95, 1997
2. IEEE, "Std 1241-2000 IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters", IEEE, 2000.
3. TelASIC, "TC1410, 14-bit, 240 MSPS Analog-to-Digital Converter", Data sheet, TelASIC Communications, 2004.
4. Kestor, W., "Analog-Digital Conversion", Analog Devices Inc., 2004