Cable life predictions from breakdown and accelerated aging tests: Influence of frequency and high fields

2009 IEEE Electrical Insulation Conference, EIC 2009

Volumn , Issue , 2009, Pages 435-438

  Crine, Jean Pierre ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

AC BREAKDOWNS; ACCELERATED AGING; ACCELERATED AGING TEST; ACTIVATION VOLUME; AGING CHARACTERISTICS; AGING PARAMETER; BASIC PARAMETERS; BREAKDOWN TESTS; CONSTANT TEMPERATURE; ELECTRICAL AGING; EXTRUDED CABLES; HIGH FIELD; LIFE PREDICTIONS; XLPE CABLES;

ACTIVATION ENERGY; TESTING;

CABLES;

EID: 70449672819     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EIC.2009.5166386     Document Type: Conference Paper

References (13)

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