A molecular model for the electrical aging of XLPE

Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP

Volumn , Issue , 2007, Pages 608-610

  Crine, J P ^a  

^a NONE   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ABS RESINS; ACTIVATION ENERGY; FREE RADICAL REACTIONS; FREE RADICALS;

ANNUAL REPORTS; DIELECTRIC PHENOMENON; ELECTRICAL AGEING; ELECTRICAL INSULATION;

FREE VOLUME; ACTIVATION ENERGY;

BASIC PARAMETERS; C-C BONDS; ELECTRICAL AGING; PHYSICAL SIGNIFICANCE; XLPE CABLES;

EID: 51249111529     PISSN: 00849162     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CEIDP.2007.4451572     Document Type: Conference Paper

References (12)

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