Electron microscopy analysis for crack propagation behavior of alumina

International Journal of Fatigue

Volumn 32, Issue 3, 2010, Pages 592-598

  Matsuo, H ^a   Mitsuhara, M ^a   Ikeda, K ^a   Hata, S ^a   Nakashima, H ^a  

^a KYUSHU UNIVERSITY   (Japan)

Author keywords

Electron tomography; High angle annular dark field scanning transmission electron microscopy (HAADF STEM); High resolution transmission electron microscopy (HR TEM); Intergranular fracture; Scanning electron microscopic electron back scattered diffraction (SEM EBSD); Transgranular fracture

Indexed keywords

ELECTRON BACK-SCATTERED DIFFRACTION; ELECTRON TOMOGRAPHY; HAADF-STEM; HIGH-ANGLE ANNULAR DARK FIELDS; INTERGRANULAR FRACTURE; SCANNING ELECTRON MICROSCOPIC; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SEM-EBSD; TRANSGRANULAR FRACTURE;

CRACK PROPAGATION; CRACKS; ELECTRIC FIELD MEASUREMENT; ELECTRIC IMPEDANCE TOMOGRAPHY; ELECTRON DIFFRACTION; ELECTRONS; FRACTURE; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; HYDROGEN EMBRITTLEMENT; LANDFORMS; SCANNING; SCANNING ELECTRON MICROSCOPY; SOIL CONSERVATION; STRESS CORROSION CRACKING; SULFUR COMPOUNDS; TEXTURES;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 70449631182     PISSN: 01421123     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijfatigue.2009.06.006     Document Type: Article

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