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Journal of Failure Analysis and Prevention
Volumn 9, Issue 5, 2009, Pages 461-465
A tin pest failure
Author keywords

Bismuth; Busbar; Failure analysis; Tin pest; XRD
Indexed keywords

ELECTRICAL CONNECTORS; ELECTRONIC DEVICE; LOW TEMPERATURES; RESTRICTION OF HAZARDOUS SUBSTANCES; TIN PEST; TIN PESTS; XRD;
EID: 70449572997     PISSN: 15477029     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11668-009-9280-8     Document Type: Article
Times cited : (27)
References (5)
  • 1
    • 41549113765 scopus 로고    scopus 로고
    • Organ pipes and tin pest
    • 10.1002/maco.200804151 1:CAS:528:DC%2BD1cXkt1Wqsbg%3D 2440859
    • A Eckert 2008 Organ pipes and tin pest Mater. Corros. 59 3 254 260 10.1002/maco.200804151 1:CAS:528:DC%2BD1cXkt1Wqsbg%3D 2440859
    • (2008) Mater. Corros. , vol.59 , Issue.3 , pp. 254-260
    • Eckert, A.1
  • 2
    • 70449618870 scopus 로고    scopus 로고
    • Tin pest: A forgotten issue in lead free soldering
    • Chicago, IL, Sept 26-30
    • Lasky, R.C.: Tin pest: a forgotten issue in lead free soldering. In: 2004 SMTA International Conference Proceedings, Chicago, IL, Sept 26-30, 2004, pp. 838-840
    • (2004) 2004 SMTA International Conference Proceedings , pp. 838-840
    • Lasky, R.C.1
  • 3
    • 70449622328 scopus 로고    scopus 로고
    • ROHS Directive-Directive 2002/95/EC
    • ROHS Directive-Directive 2002/95/EC
  • 4
    • 37249073934 scopus 로고    scopus 로고
    • Recent observations on tin pest formation in solder alloys
    • DOI 10.1007/s11664-007-0165-x
    • W Plumbridge 2008 Recent observations on tin pest formation in solder alloys J. Electron. Mater. 37 2 218 223 10.1007/s11664-007-0165-x 2008JEMat..37..218P 1:CAS:528:DC%2BD1cXmtV2gtg%3D%3D (Pubitemid 350275999)
    • (2008) Journal of Electronic Materials , vol.37 , Issue.2 , pp. 218-223
    • Plumbridge, W.J.1
  • 5
    • 0035359283 scopus 로고    scopus 로고
    • Tin pest in Sn-05wt.% Cu lead-free solder
    • 10.1007/s11837-001-0101-0
    • W Plumbridge C Gagg N Williams Y Kariya 2001 Tin pest in Sn-05wt.% Cu lead-free solder JOM 53 6 39 41 10.1007/s11837-001-0101-0
    • (2001) JOM , vol.53 , Issue.6 , pp. 39-41
    • Plumbridge, W.1    Gagg, C.2    Williams, N.3    Kariya, Y.4

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.