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Volumn 94, Issue 1, 2010, Pages 17-21
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Morphological characterization and AES depth profile analysis of CuInS2 thin films
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Author keywords
CuInS2; Solar cells; Thin films
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Indexed keywords
ABSORBER LAYERS;
AES DEPTH PROFILE;
AUGER ELECTRON SPECTROSCOPY DEPTH PROFILES;
CHEMICAL COMPOSITIONS;
CIS FILM;
CUINS2;
DEPOSITION PROCESS;
FILM SURFACES;
GRAIN SIZE;
MORPHOLOGICAL CHARACTERIZATION;
MORPHOLOGICAL PROPERTIES;
PREPARATION CONDITIONS;
S-PHASE;
SEM;
SODA LIME GLASS SUBSTRATE;
SURFACE LAYERS;
SURFACE REGION;
THIN FILM SOLAR CELLS;
THREE-STAGE PROCESS;
TWO STAGE;
TWO-STAGE PROCESS;
ATOMIC FORCE MICROSCOPY;
ATOMIC SPECTROSCOPY;
AUGER ELECTRON SPECTROSCOPY;
CHEMICAL REACTIONS;
PHOTOVOLTAIC CELLS;
SCANNING ELECTRON MICROSCOPY;
SOLAR CELLS;
THIN FILMS;
COPPER;
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EID: 70449532443
PISSN: 09270248
EISSN: None
Source Type: Journal
DOI: 10.1016/j.solmat.2009.04.011 Document Type: Article |
Times cited : (8)
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References (9)
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