On-chip structures for timing measurement and test

Proceedings - International Symposium on Asynchronous Circuits and Systems

Volumn , Issue , 2002, Pages 190-197

  Kinniment, D J ^a   Maevsky, O V ^a   Bystrov, A ^a   Russell, G ^a   Yakovlev, A V ^a  

^a NEWCASTLE UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG TO DIGITAL CONVERSION; DELAY CIRCUITS; STATISTICAL TESTS; TIMING CIRCUITS;

A/D CONVERTER; CONDITION; ON CHIPS; ON-CHIP SIGNALS; ON-CHIP STRUCTURES; SIGNAL PATHS; SUCCESSIVE APPROXIMATION METHODS; TAPPED DELAY LINE; TIME COMPARISON; TIMING MEASUREMENT;

APPROXIMATION THEORY;

EID: 70449508742     PISSN: 15228681     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (8)

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