Onset kinetics of thermal degradation of ultrathin polyacrylamide films

Macromolecules

Volumn 42, Issue 20, 2009, Pages 7889-7896

  Mukherjee, S ^a   Mondal, Mojammel H ^a   Mukherjee, M ^a   Doyle, B P ^b,d   Nannarone, S ^b,c  

^a SAHA INSTITUTE OF NUCLEAR PHYSICS   (India)

^b LABORATORIO TASC   (Italy)

^c UNIVERSITY OF MODENA AND REGGIO EMILIA   (Italy)

^d UNIVERSITY OF JOHANNESBURG   (South Africa)

Author keywords

[No Author keywords available]

Indexed keywords

AMIDE GROUPS; DEGRADATION PRODUCTS; ELECTRON DENSITIES; HEATED FILMS; INTERFACIAL MORPHOLOGIES; NEAR-EDGE X-RAY ABSORPTION FINE STRUCTURE SPECTROSCOPIES; ONSET TEMPERATURE; PHOTO-INDUCED; POLYACRY LAMIDE; POLYACRYLAMIDE FILMS; POLYMER CHAINS; QUANTITATIVE ANALYSIS; REFLECTIVITY DATA; SIMULTANEOUS BREAKDOWN; STRUCTURAL ASPECTS; STRUCTURAL MODIFICATIONS; THERMAL DEGRADATIONS; THICKNESS OF THE FILM; ULTRA-THIN; X RAY REFLECTIVITY; XPS SPECTRA;

ABSORPTION SPECTROSCOPY; AMIDES; CHEMICAL ANALYSIS; DEGRADATION; FUNCTIONAL POLYMERS; HEATING; PHOTODEGRADATION; POLYMER FILMS; POLYMERS; REFLECTION; THERMOGRAVIMETRIC ANALYSIS; ULTRATHIN FILMS; X RAY ANALYSIS;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 70449435491     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma901294t     Document Type: Article

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