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Volumn 25, Issue 21, 2009, Pages 12481-12487

Scanning probe microscopy method for nanosuspension stabilizer selection

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION CHARACTERISTIC; AFM; AFM IMAGE; DEGREE OF SUBSTITUTION; NANO-SUSPENSIONS; POLOXAMER; POLYMERIC STABILIZERS; POOR PERFORMANCE; SURFACE ADSORPTION; TOPDOWN; TRIAL-AND-ERROR METHOD;

EID: 70449348839     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la9016432     Document Type: Article
Times cited : (94)

References (31)
  • 30
    • 70449453278 scopus 로고    scopus 로고
    • Cambridge Crystallographic Data Centre, Cambridge, U.K.
    • Cambridge Crystallographic Data Centre, Cambridge, U.K.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.