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Volumn 256, Issue 2, 2009, Pages 558-561

Surface roughness and power spectral density study of SHI irradiated ultra-thin gold films

(10) Dash, P a Mallick, P b Rath, H a Tripathi, A c Prakash, Jai c Avasthi, D K c Mazumder, S d Varma, S d Satyam, P V d Mishra, N C a

a UTKAL UNIVERSITY (India)

b Maharaja Sriram Chandra Bhanja Deo University (India)

c INTER UNIVERSITY ACCELERATOR CENTRE (India)

d INSTITUTE OF PHYSICS (India)

Author keywords

Atomic force microscopy; Electronic excitation; Swift heavy ion irradiation

Indexed keywords

ATOMIC FORCE MICROSCOPY; GOLD DEPOSITS; HEAVY IONS; ION BOMBARDMENT; SILVER; SPECTRAL DENSITY; SURFACE ROUGHNESS; THICK FILMS;

ELECTRONIC EXCITATION; HIGH FREQUENCY HF; IRRADIATED SAMPLES; MATERIALS MODIFICATION; MICROSTRUCTURAL ANALYSIS; POWER SPECTRAL DENSITIES (PSD); SWIFT HEAVY ION IRRADIATION; SWIFT HEAVY IONS;

POWER SPECTRAL DENSITY;

EID: 70449088946 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/j.apsusc.2009.08.046 Document Type: Article

Times cited : (54)

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