Direct Observation of the Hubbard Gap in a Semiconductor

Physical Review Letters

Volumn 78, Issue 18, 1997, Pages 3519-3522

  Dubon, O D ^a,b   Walukiewicz, W ^b   Beeman, J W ^b   Haller, E E ^a,b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BINDING ENERGY; CALCULATIONS; CARRIER CONCENTRATION; COPPER; ELECTRIC CONDUCTIVITY MEASUREMENT; HALL EFFECT; INFRARED SPECTROSCOPY; SEMICONDUCTING GERMANIUM; THERMAL EFFECTS;

BOHR RADIUS; HOLE CONCENTRATION; HOLE MOBILITY; HUBBARD GAP;

ENERGY GAP;

EID: 7044284784     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.78.3519     Document Type: Article

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