Electronic transport processes in heavily doped uncompensated and compensated silicon as probed by the thermoelectric power

Physical Review Letters

Volumn 77, Issue 16, 1996, Pages 3395-3398

  Liu, X ^a   Sidorenko, A ^a   Wagner, S ^a   Ziegler, P ^a   Lohneysen H V ^a  

^a UNIVERSITY OF KARLSRUHE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTRON SCATTERING; ELECTRON TRANSPORT PROPERTIES; ENERGY GAP; PHOSPHORUS; SEMICONDUCTOR DOPING; THERMAL EFFECTS; THERMOELECTRICITY;

ACTIVATED TRANSPORT PROCESS; ELECTRON-ELECTRON INTERACTIONS; HUBBARD BAND SPLITTING; THERMOELECTRIC POWER MEASUREMENT; VARIABLE RANGE HOPPING;

SEMICONDUCTING SILICON;

EID: 0030262623     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.77.3395     Document Type: Article

References (26)

1. H. Fritzsche, J. Phys. Chem. Solids 6, 69 (1958). JPCSAW
2. T. H. Geballe and G. W. Hull, Phys. Rev. 98, 940 (1955). PHRVAO
3. M. A. Paalanen, T. F. Rosenbaum, G. A. Thomas, and R. N. Bhatt, Phys. Rev. Lett. 48, 1284 (1982)
4. G. A. Thomas, M. A. Paalanen, and T. F. Rosenbaum, Phys. Rev. B 27, 3897 (1983). PRBMDO
5. P. Dai, Y. Zhang, and M. P. Sarachik, Phys. Rev. Lett. 66, 1914 (1991). PRLTAO
6. H. Stupp, M. Hornung, M. Lakner, O. Madel, and H. v. Löhneysen, Phys. Rev. Lett. 71, 2634 (1993). PRLTAO
7. P. A. Lee and T. V. Ramakrishnan, Rev. Mod. Phys. 57, 287 (1985). RMPHAT
8. D. Belitz and T. R. Kirkpatrick, Rev. Mod. Phys. 66, 261 (1994). RMPHAT
9. G. A. Thomas, Philos. Mag. B 52, 479 (1985). PMABDJ
10. A. L. Efros and B. L. Shklovskii, J. Phys. C 8, L49 (1975). JPSOAW
11. N. F. Mott and E. A. Davis, Electronic Processes in Non-Crystalline Materials (Clarendon Press, Oxford, 1979), 2nd ed.
12. M. Lakner and H. v. Löhneysen, Phys. Rev. Lett. 70, 3475 (1993). PRLTAO
13. P. Ziegler, M. Lakner, and H. v. Löhneysen, Europhys. Lett. 33, 285 (1996). EULEEJ
14. M. J. Hirsch, D. F. Holcomb, R. N. Bhatt, and M. A. Paalanen, Phys. Rev. Lett. 68, 1418 (1992). PRLTAO
15. W. R. Thurber, R. L. Mattis, Y. M. Liu, and J. J. Filliben, J. Electrochem. Soc. 127, 1807 (1980). JESOAN
16. U. Thomanschefsky and D. F. Holcomb, Phys. Rev. B 45, 13 356 (1992)
17. U. Thomanschefsky, Ph.D. thesis, Cornell University, Ithaca, NY, 1990 (unpublished). PRBMDO
18. K. D. D. Rathnayaka, J. Phys. E 18, 380 (1985). JPSIAE
19. M. J. Burns and P. M. Chaikin, J. Phys. C 18, L743 (1985). JPSOAW
20. I. P. Zvyagin, in Hopping Transport in Solids, M. Pollack and B. Shklovskii (North-Holland, Amsterdam, 1991) p. 143.
21. M. J. Smith and P. N. Butcher, J. Phys. Condens. Matter 2, 2375 (1990). JCOMEL
22. F. Norton, Phys. Rev. Lett. 37, 164 (1976). PRLTAO
23. G. A. Thomas, M. Capizzi, F. DeRosa, R. N. Bhatt, and T. M. Rice, Phys. Rev. B 23, 5472 (1981). PRBMDO
24. A. Gaymann, H. P. Geserich, and H. v. Löhneysen, Phys. Rev. B 52, 16 486 (1995). PRBMDO
25. R. N. Bhatt and T. M. Rice, Phys. Rev. B 23, 1920 (1981). PRBMDO
26. S. Wagner, M. Lakner, and H. v. Löhneysen (to be published).