Determination of magnetic exchange stiffness and surface anisotropy constants in epitaxial Ni1-xCox(001) films

Physical Review B - Condensed Matter and Materials Physics

Volumn 66, Issue 14, 2002, Pages 1444261-1444266

  Talagala, P ^a   Fodor, P S ^a   Haddad, D ^a   Naik, R ^a   Wenger, L E ^a   Vaishnava, P P ^b   Naik, V M ^c  

^a WAYNE STATE UNIVERSITY   (United States)

^b KETTERING UNIVERSITY   (United States)

^c UNIVERSITY OF MICHIGAN DEARBORN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALLOY; COBALT COMPLEX; NICKEL COMPLEX; SILICON DERIVATIVE;

ANISOTROPY; ARTICLE; FILM; LOW TEMPERATURE PROCEDURES; MAGNETIC FIELD; MATHEMATICAL ANALYSIS; MEASUREMENT; X RAY DIFFRACTION;

EID: 7044284543     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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