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Volumn 2689, Issue , 2003, Pages 437-451

Case base management for analog circuits diagnosis improvement

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG CIRCUITS; ARTIFICIAL INTELLIGENCE; RECONFIGURABLE HARDWARE; COMPUTER AIDED DIAGNOSIS; COMPUTER SCIENCE; FORMAL LOGIC; INTEGRATED CIRCUIT LAYOUT;

EID: 7044274059     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/3-540-45006-8_34     Document Type: Conference Paper
Times cited : (5)

References (13)
  • 1
    • 0022107260 scopus 로고
    • Fault diagnosis of analog circuits
    • Bandler, J., Salama, A.: Fault diagnosis of analog circuits. Proceedings of the IEEE 73 (1985) 1279–1325
    • (1985) Proceedings of the IEEE , vol.73 , pp. 1279-1325
    • Bandler, J.1    Salama, A.2
  • 5
    • 84958066732 scopus 로고    scopus 로고
    • Tolerance Analysis of Electronic Circuits Using Matlab
    • CRC Press
    • Boyd, R.: Tolerance Analysis of Electronic Circuits Using Matlab. Electronics Engineering. CRC Press (1999) ISBN: 0-8493-2276-6.
    • (1999) Electronics Engineering
    • Boyd, R.1
  • 9
    • 0343081513 scopus 로고    scopus 로고
    • Reduction techniques for instance-based learning algorithms
    • Wilson, D., Martinez, T.: Reduction techniques for instance-based learning algorithms. Machine Learning 38 (2000) 257–286
    • (2000) Machine Learning , vol.38 , pp. 257-286
    • Wilson, D.1    Martinez, T.2
  • 12
    • 0025479316 scopus 로고
    • A desing for test methodology for active analog filters
    • Soma, M.: A desing for test methodology for active analog filters, IEEE (1990) 183–192
    • (1990) IEEE , pp. 183-192
    • Soma, M.1
  • 13
    • 0018495473 scopus 로고
    • Automatic test generation techniques for analog circuits and systems: A review
    • Duhamel, P., Rault, J.: Automatic test generation techniques for analog circuits and systems: A review. IEEE Transactions on Circuits and Systems Cas-26 (1979) 411–440
    • (1979) IEEE Transactions on Circuits and Systems Cas-26 , pp. 411-440
    • Duhamel, P.1    Rault, J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.