-
1
-
-
0022107260
-
Fault diagnosis of analog circuits
-
Bandler, J., Salama, A.: Fault diagnosis of analog circuits. Proceedings of the IEEE 73 (1985) 1279–1325
-
(1985)
Proceedings of the IEEE
, vol.73
, pp. 1279-1325
-
-
Bandler, J.1
Salama, A.2
-
2
-
-
0035435324
-
Fault diagnosis of electronic systems using intelligent techniques: A review
-
Fenton, W.G., McGinnity, T.M., Maguire, L.P.: Fault diagnosis of electronic systems using intelligent techniques: A review. IEEE Transactions on Systems, Man and Cybernetics. Part C: Applications and Reviews 31 (2001) 269–281
-
(2001)
IEEE Transactions on Systems, Man and Cybernetics. Part C: Applications and Reviews
, vol.31
, pp. 269-281
-
-
Fenton, W.G.1
McGinnity, T.M.2
Maguire, L.P.3
-
3
-
-
0034243302
-
Finding ambiguity groups in low testability analog circuits
-
Starzik, J., Pang, J., Manetti, S., Piccirilli, M., Fedi, G.: Finding ambiguity groups in low testability analog circuits. IEEE Transactions on Circuits and Systems. Fundamental Theory and Applications 47 (2000) 1125–1137
-
(2000)
IEEE Transactions on Circuits and Systems. Fundamental Theory and Applications
, vol.47
, pp. 1125-1137
-
-
Starzik, J.1
Pang, J.2
Manetti, S.3
Piccirilli, M.4
Fedi, G.5
-
4
-
-
0024750674
-
Ambiguity groups and testability
-
Stenbakken, G., Souders, T., Stewart, G.: Ambiguity groups and testability. IEEE Transactions on Instrumentation and Measurement 38 (1989) 941–947
-
(1989)
IEEE Transactions on Instrumentation and Measurement
, vol.38
, pp. 941-947
-
-
Stenbakken, G.1
Souders, T.2
Stewart, G.3
-
5
-
-
84958066732
-
Tolerance Analysis of Electronic Circuits Using Matlab
-
CRC Press
-
Boyd, R.: Tolerance Analysis of Electronic Circuits Using Matlab. Electronics Engineering. CRC Press (1999) ISBN: 0-8493-2276-6.
-
(1999)
Electronics Engineering
-
-
Boyd, R.1
-
6
-
-
0031343446
-
Hierarchical specification-driven analog fault modeling for efficient fault simulation and diagnosis
-
Voorakaranam, R., Chakrabarti, S., Hou, J., Gomes, A., Cherubal, S., Chatterjee, A.: Hierarchical specification-driven analog fault modeling for efficient fault simulation and diagnosis. International Test Conference (1997) 903–912
-
(1997)
International Test Conference
, pp. 903-912
-
-
Voorakaranam, R.1
Chakrabarti, S.2
Hou, J.3
Gomes, A.4
Cherubal, S.5
Chatterjee, A.6
-
9
-
-
0343081513
-
Reduction techniques for instance-based learning algorithms
-
Wilson, D., Martinez, T.: Reduction techniques for instance-based learning algorithms. Machine Learning 38 (2000) 257–286
-
(2000)
Machine Learning
, vol.38
, pp. 257-286
-
-
Wilson, D.1
Martinez, T.2
-
11
-
-
2942659440
-
-
(IEEE Mixed-Signal Testing Technical Activity Committee)
-
Kaminska, B., Arabi, K., Goteti, P., Huertas, J., Kim, B., Rueda, A., Soma, M.: Analog and mixed-signal benchmark circuits. first release. (IEEE Mixed-Signal Testing Technical Activity Committee)
-
Analog and Mixed-Signal Benchmark Circuits. First Release.
-
-
Kaminska, B.1
Arabi, K.2
Goteti, P.3
Huertas, J.4
Kim, B.5
Rueda, A.6
Soma, M.7
-
12
-
-
0025479316
-
A desing for test methodology for active analog filters
-
Soma, M.: A desing for test methodology for active analog filters, IEEE (1990) 183–192
-
(1990)
IEEE
, pp. 183-192
-
-
Soma, M.1
-
13
-
-
0018495473
-
Automatic test generation techniques for analog circuits and systems: A review
-
Duhamel, P., Rault, J.: Automatic test generation techniques for analog circuits and systems: A review. IEEE Transactions on Circuits and Systems Cas-26 (1979) 411–440
-
(1979)
IEEE Transactions on Circuits and Systems Cas-26
, pp. 411-440
-
-
Duhamel, P.1
Rault, J.2
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