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Volumn 85, Issue 12, 2004, Pages 2178-2180
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Three-dimensional wavelength-scale confinement in quantum dot microcavity light-emitting diodes
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
COHERENT LIGHT;
EIGENVALUES AND EIGENFUNCTIONS;
ELECTROMAGNETIC FIELD EFFECTS;
ELECTRON BEAM LITHOGRAPHY;
ETCHING;
LIGHT EMITTING DIODES;
MIRRORS;
MOLECULAR BEAM EPITAXY;
OPTIMIZATION;
OXIDATION;
PHOTONS;
RESONANCE;
SCANNING ELECTRON MICROSCOPY;
SEMICONDUCTING GALLIUM ARSENIDE;
SPONTANEOUS EMISSION;
ELECTRICAL PUMPING;
LATERAL CURRENTS;
QUANTUM DOT MICROCAVITY LIGHT-EMITTING DIODES;
THREE-DIMENSIONAL WAVELENGTH-SCALE CONFINEMENT;
SEMICONDUCTOR QUANTUM DOTS;
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EID: 7044269265
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1791341 Document Type: Article |
Times cited : (33)
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References (14)
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