Determination of optical constants (n, k, d) of very thin films deposited on absorbing substrate

Vacuum

Volumn 76, Issue 2-3, 2004, Pages 185-189

  Gushterova, P ^a   Sharlandjiev, P ^a  

^a CENTRAL LABORATORY OF OPTICAL STORAGE AND PROCESSING OF INFORMATION   (Bulgaria)

Author keywords

Absorbing substrate; Oblique incidence; Optical constants; Very thin films

Indexed keywords

ABSORPTION; APPROXIMATION THEORY; DEPOSITION; LIGHT POLARIZATION; LIGHT REFLECTION; MATRIX ALGEBRA; REFRACTIVE INDEX; SPECTROPHOTOMETERS;

OBLIQUE INCIDENCE; OPTICAL CONSTANTS; OPTICAL STORAGE; VERY THIN FILMS;

THIN FILMS;

EID: 7044233136     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vacuum.2004.07.009     Document Type: Conference Paper

References (5)

1. Born M, Wolf E. Principles of optics. Oxford: Pergamon; 1983 p. 55.
2. Pekker D, Pekker L. Thin Solid Films 2003;425:203-9.
3. Gonzales-Leal J-M, Prieto-Alkon R, Angel J-A, Minkov DA, Marquez E. Appl Opt 2002;41:7300-8.
4. Necati Ecevit F, Koysal O, Olan D, Ozder S. Opt Commun 2002;205:1-6.
5. Gushterova P, Sharlandjiev P. J Mater Sci: Materials in Electronics 2003;14:863-4.