Time-wavelength reflectance maps of photonic crystal waveguides: A new view on disorder-induced scattering

Journal of Lightwave Technology

Volumn 26, Issue 23, 2008, Pages 3794-3802

  Parini, Albeto ^a   Hamel, Philippe ^b   De Rossi, Alfredo ^c   Combrié, Sylvain ^c   Tran, Nguyen Vi Quynh ^c   Gottesman, Yaneck ^a   Gabet, Renaud ^b   Talneau, Anne ^d   Jaouën, Yves ^b   Vadalà, Giovanni ^c,e  

^a TELECOM SUDPARIS   (France)

^b TELECOM PARISTECH   (France)

^c THALES RESEARCH AND TECHNOLOGY   (France)

^d UNIV PARIS SUD   (France)

^e UNIVERSITY OF PADOVA   (Italy)

Author keywords

Disorder; Optical low coherence reflectometry (OLCR); Photonic crystal; Slow light

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; LASER OPTICS; OPTICAL WAVEGUIDES; POINT DEFECTS; REFLECTION; REFLECTOMETERS; SCATTERING; WAVEGUIDES;

AMOUNT OF INFORMATIONS; DISORDER; GROUP VELOCITIES; LEAKY MODES; MODE SCATTERINGS; NUMERICAL PROCESSING; OPTICAL LOW-COHERENCE REFLECTOMETRY (OLCR); PHASE SENSITIVES; PHOTONIC CRYSTAL WAVEGUIDES; PROPAGATION LOSS; REFLECTANCE MAPS; SLOW LIGHT; THEORETICAL PREDICTIONS;

PHOTONIC CRYSTALS;

EID: 61349108273     PISSN: 07338724     EISSN: None     Source Type: Journal    
DOI: 10.1109/JLT.2008.2004957     Document Type: Article

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