Using metrics for assessing the quality of ASF+SDF model transformations

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

Volumn 5563 LNCS, Issue , 2009, Pages 239-248

  Van Amstel, Marcel F ^a   Lange, Christian F J ^b   Van Den Brand, Mark G J ^a  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b Federal Office for Information Technology   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ASF+SDF; HETEROGENEOUS MODELS; MEASUREMENT RESULTS; MODEL TRANSFORMATION; MODEL-DRIVEN ENGINEERING; QUALITY ATTRIBUTES; SOFTWARE ARTIFACTS;

METRIC SYSTEM; RESPONSE TIME (COMPUTER SYSTEMS);

QUALITY CONTROL;

EID: 70350678757     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/978-3-642-02408-5_17     Document Type: Conference Paper

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