Tracing ridges on B-spline surfaces

Proceedings - SPM 2009: SIAM/ACM Joint Conference on Geometric and Physical Modeling

Volumn , Issue , 2009, Pages 55-66

  Musuvathy, Suraj ^a   Cohen, Elaine ^a   Seong, Joon Kyung ^b   Damon, James ^c  

^a Department of Electrical and Computer Engineering   (United States)

^b Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^c UNIVERSITY OF NORTH CAROLINA   (United States)

Author keywords

Crest; Ridge

Indexed keywords

B-SPLINE SURFACE; CHARACTERISTIC CURVE; COMPLEX BEHAVIOR; CREST; CRITICAL VALUE; CURVE SEGMENTS; INTRINSIC FEATURES; OTHER APPLICATIONS; PRINCIPAL CURVATURE; PRINCIPAL DIRECTIONS; RIDGE; SAMPLING TECHNIQUE; SHAPE MATCHING; SURFACE QUALITY CONTROL; TURNING POINTS;

MODELS; QUALITY FUNCTION DEPLOYMENT; SPLINES; TOTAL QUALITY MANAGEMENT; TURNING;

GRAPH THEORY;

EID: 70350676822     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1629255.1629263     Document Type: Conference Paper

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