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Volumn 487, Issue 1-2, 2009, Pages 47-51
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Raman spectroscopy of type-I and type-VIII silicon clathrate alloys Sr8AlxGa16-xSi30
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Author keywords
Einstein temperature; Phase transition; Raman spectroscopy; Silicon clathrates; Thermoelectric materials
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Indexed keywords
AMBIENT TEMPERATURES;
ATOMIC DISPLACEMENT PARAMETERS;
EINSTEIN TEMPERATURE;
HIGHER FREQUENCIES;
RAMAN BANDS;
RAMAN SPECTRA;
SILICON CLATHRATES;
THERMOELECTRIC MATERIALS;
VIBRATIONAL FREQUENCIES;
ALUMINUM;
GALLIUM;
HYDRATES;
RAMAN SCATTERING;
RAMAN SPECTROSCOPY;
SILICON;
SILICON ALLOYS;
THERMOELECTRIC EQUIPMENT;
THERMOELECTRICITY;
X RAY DIFFRACTION;
PHASE TRANSITIONS;
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EID: 70350621246
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jallcom.2009.08.048 Document Type: Article |
Times cited : (15)
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References (24)
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