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Volumn 95, Issue 16, 2009, Pages

Influence of bin time and excitation intensity on fluorescence lifetime distribution and blinking statistics of single quantum dots

(4) Lee, Der Hau a Yuan, Chi Tsu a Tachiya, M b Tang, Jau a

a RESEARCH CENTER FOR APPLIED SCIENCES (Taiwan)

b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BLINKING STATISTICS; CDSE/ZNS QUANTUM DOTS; EXCITATION INTENSITY; FLUORESCENCE LIFETIMES; MATRIX; PHOTON COUNT; QUANTUM DOT; SINGLE QUANTUM DOT; STATISTICAL VARIANCE;

BENDING (FORMING); BINS; FLUORESCENCE;

SEMICONDUCTOR QUANTUM DOTS;

EID: 70350395469 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3236772 Document Type: Article

Times cited : (15)

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