Molecular mapping of Verticillium wilt resistance QTL clustered on chromosomes D7 anD D9 in upland cotton

Science in China, Series C: Life Sciences

Volumn 52, Issue 9, 2009, Pages 872-884

  Jiang, Feng ^a   Zhao, Jun ^a   Zhou, Lei ^a   Guo, Wang Zhen ^a   Zhang, Tian Zhen ^a  

^a NANJING AGRICULTURAL UNIVERSITY   (China)

Author keywords

Genetic model; QTL mapping; Upland cotton; Verticillium wilt

Indexed keywords

PLANT DNA;

ARTICLE; CHROMOSOME MAP; COTTON; GENETICS; ISOLATION AND PURIFICATION; MICROBIOLOGY; PATHOGENICITY; PLANT CHROMOSOME; PLANT DISEASE; PLANT GENE; QUANTITATIVE TRAIT LOCUS; VERTICILLIUM;

CHROMOSOME MAPPING; CHROMOSOMES, PLANT; DNA, PLANT; GENES, PLANT; GOSSYPIUM; PLANT DISEASES; QUANTITATIVE TRAIT LOCI; VERTICILLIUM;

GOSSYPIUM HIRSUTUM; VERTICILLIUM DAHLIAE;

EID: 70350379595     PISSN: 10069305     EISSN: 18622798     Source Type: Journal    
DOI: 10.1007/s11427-009-0110-8     Document Type: Article

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